Structural and electrical characterization of La0.72Ca0.28MnO3 ceramic and thin films

► La0.72Ca0.28MnO3 films were prepared on flat and 15° vicinal cut LaAlO3 substrate by pulsed laser deposition method. ► The target used was fabricated with powders synthesized through sol-gel process. ► Rocking curve and atomic force microscope images demonstrate the high crystalline quality. ► The film deposited on tilted substrate shows a more uniform grain size. ► The film deposited on tilted substrate shows a larger temperature coefficient of resistance value (11.3%).