کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5354759 1388180 2012 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Chemical and structural analysis of the bone-implant interface by TOF-SIMS, SEM, FIB and TEM: Experimental study in animal
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Chemical and structural analysis of the bone-implant interface by TOF-SIMS, SEM, FIB and TEM: Experimental study in animal
چکیده انگلیسی
► Time of flight-secondary ion mass spectroscopy (TOF-SIMS) is a valuable tool for assessing the chemical aspects of the bone-implant interface. ► TOF-SIMS analysis could be done in combination with other techniques such as light and electron microscopy. ► Chemical and structural analysis from macro to nano could be achieved by combining different techniques. ► Sample preparation induce artifacts which has to be considered for each analysis.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 258, Issue 17, 15 June 2012, Pages 6485-6494
نویسندگان
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