Chemical and structural analysis of the bone-implant interface by TOF-SIMS, SEM, FIB and TEM: Experimental study in animal

► Time of flight-secondary ion mass spectroscopy (TOF-SIMS) is a valuable tool for assessing the chemical aspects of the bone-implant interface. ► TOF-SIMS analysis could be done in combination with other techniques such as light and electron microscopy. ► Chemical and structural analysis from macro to nano could be achieved by combining different techniques. ► Sample preparation induce artifacts which has to be considered for each analysis.