Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Scanning electron microscopy (SEM); Crystalline oxides; Plastic deformation; Micro-mechanical testing;
مقالات ISI پرتو یون متمرکز (FIB) (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: پرتو یون متمرکز (FIB); Zirconium oxide; Corrosion; Focused ion beam (FIB); Transmission electron microscopy (TEM); Electron backscatter diffraction (EBSD);
Keywords: پرتو یون متمرکز (FIB); Dislocation structures; Fatigue crack initiation; Focused ion beam (FIB); Microstructure-inclusion interaction; Very high cycle fatigue;
Keywords: پرتو یون متمرکز (FIB); Annealing; 3D reconstruction; Focused ion beam (FIB); Cellular materials; Nanoporous gold;
Keywords: پرتو یون متمرکز (FIB); Power device; Failure analysis; Metallization microstructure aging; Scanning Electron Microscopy (SEM); Focused Ion Beam (FIB); Temperature cycles; Curvature experiment;
Keywords: پرتو یون متمرکز (FIB); 3D electron back scattered diffraction; Ion beam polishing; Scanning electron microscopy; Focused ion beam (FIB); Computed tomography (CT); Cermet;
Keywords: پرتو یون متمرکز (FIB); Alumina; Microscopic strength; c-shape; Micro-cantilever; Focused ion beam (FIB);
Keywords: پرتو یون متمرکز (FIB); Toughness; Focused Ion Beam (FIB); Finite element analysis; Fused quartz; Chevron notch;
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Atomic force microscopy (AFM) nanoindentation; Nano-patterning; Hydrogenated amorphous carbon; Protein adsorption
Keywords: پرتو یون متمرکز (FIB); Al-Si alloys; Silicon; Particle; Fracture; Focused ion beam (FIB);
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Broad ion beam (BIB); Organic matter; Optical properties; Nanoporosity; Random reflectance (Ro);
Keywords: پرتو یون متمرکز (FIB); Nuclear nanoprobe; RBS; Time-of-flight (TOF); Focused ion beam (FIB); Three-dimensional analysis;
Keywords: پرتو یون متمرکز (FIB); Nanocrystalline diamond; Micro/nanoelectromechanical systems (MEMS/NEMS); Torsional resonator; Focused ion beam (FIB); High frequency; Young's modulus
Keywords: پرتو یون متمرکز (FIB); Toughness; Focused ion beam (FIB); Finite element analysis (FEA); Alumina (α-Al2O3); Fused quartz;
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Grain boundary segregation; Transmission electron backscatter diffraction (t-EBSD); Transmission Kikuchi diffraction (TKD); Atom probe tomography (APT); Transmission electron forward scatter diffraction (t-EFSD)
Keywords: پرتو یون متمرکز (FIB); Fatigue test; Fatigue; Metallic glass; Focused ion beam (FIB);
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Residual stress; Digital image correlation (DIC); DLC; Hydrogenated amorphous carbon (a-C:H);
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Stress relaxation; Digital image correlation (DIC); Microcrystalline diamond; Raman spectroscopy;
Keywords: پرتو یون متمرکز (FIB); Nematode; Elemental distribution; Electron probe microanalysis (EPMA); Focused ion beam (FIB); Cuticle;
A model of splats deposition state and wear resistance of WC-10Co4Cr coating
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Low temperature high velocity oxygen-fuel flame (LT-HVOF); High velocity oxygen-fuel flame (HVOF); Residual stress; Wear resistance;
Micro 3D measurement applied to interfacial deformation of bilayer thin film/substrate structure under thermal cycling loads
Keywords: پرتو یون متمرکز (FIB); Gratings; Deformation measurement; Focused ion beam (FIB); Bilayer thin film;
Initiation and propagation of microcracks in Cu thin films on flexible substrates through the thickness direction during a cyclic bending test
Keywords: پرتو یون متمرکز (FIB); Thin film; Bending test; Electron backscatter diffraction (EBSD); Focused ion beam (FIB); Grain boundaries;
Twin boundary-accelerated ferritization of austenitic stainless steels in liquid lead-bismuth eutectic
Keywords: پرتو یون متمرکز (FIB); Steels; Liquid metal corrosion (LMC); Focused ion beam (FIB); Electron backscattering diffraction (EBSD); Scanning/transmission electron microscopy (STEM);
Mechanical deformation of WC–Co composite micropillars under uniaxial compression
Keywords: پرتو یون متمرکز (FIB); Cemented carbides; Microcompression testing; Plastic deformation; Damage mechanisms; Focused ion beam (FIB)
The Residual Strain Measurement of Thin Conductive Metal Wire after Electrical Failure with SEM Moiré
Keywords: پرتو یون متمرکز (FIB); SEM moire; residual strain; metal wire; focused ion beam (FIB);
Three dimensional microstructural characterization of nanoscale precipitates in AA7075-T651 by focused ion beam (FIB) tomography
Keywords: پرتو یون متمرکز (FIB); AA 7075-T651; Precipitates; Grains; Focused ion beam (FIB)
Complex 3D nanocoral like structures formed by copper nanoparticle aggregation on nanostructured zinc oxide rods
Keywords: پرتو یون متمرکز (FIB); Pulsed plasma; Nanostructured materials; Scanning electron microscopy; Focused ion beam (FIB); Scanning transmission electron microscopy;
Characterisation of nano-grains in MgB2 superconductors by transmission Kikuchi diffraction
Keywords: پرتو یون متمرکز (FIB); Transmission Kikuchi diffraction (TKD); Scanning electron microscope (SEM); Focused ion beam (FIB); Superconductors;
Nucleation of fcc Ta when heating thin films
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); High-resolution electron microscopy (HREM); Transmission electron microscopy (TEM); Crystal structure; Tantalum;
Grain boundary study of technically pure molybdenum by combining APT and TKD
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Grain boundary segregation; Transmission-electron backscatter diffraction (t-EBSD); Transmission Kikuchi diffraction (TKD); Atom probe tomography (APT); Field ion microscopy (FIM);
Micromechanical and in situ shear testing of Al-SiC nanolaminate composites in a transmission electron microscope (TEM)
Keywords: پرتو یون متمرکز (FIB); Transmission electron microscope (TEM); Focused ion beam (FIB); Nanostructured materials; Interface; Shear testing; Composites;
Crystal structure determination of the Î2 phase in the Fe-Zn-Al system by single-crystal synchrotron X-ray diffraction combined with scanning transmission electron microscopy
Keywords: پرتو یون متمرکز (FIB); Intermetallic phase; Galvannealed steel; Phase diagram; Coordination polyhedra; Icosahedron; Focused ion beam (FIB);
Investigation of resins suitable for the preparation of biological sample for 3-D electron microscopy
Keywords: پرتو یون متمرکز (FIB); Radiation damage; Shrinkage of resin section; Epoxy; Methacrylate; Epon; Lowicryl; Durcupan; Focused ion beam (FIB); Scanning electron microscope (SEM); Transmission electron microscope (TEM); Tomography; Atomic force microscopy (AFM);
Annealing recovery of nanoscale silicon surface damage caused by Ga focused ion beam
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Annealing; Silicon; Gallium; Molecular dynamics (MD);
Microstructural evolution of a focused ion beam fabricated Mg nanopillar at high temperatures: Defect annihilation and sublimation
Keywords: پرتو یون متمرکز (FIB); Magnesium; Gallium; Focused ion beam (FIB); Dislocations; Sublimation
Single CdS nanowire photodetector fabricated by FIB
Keywords: پرتو یون متمرکز (FIB); Cadmium sulfide (CdS) nanowire; Photodetector; Focused ion beam (FIB)
The deformation of B4C particle in the B4C/2024Al composites after high velocity impact
Keywords: پرتو یون متمرکز (FIB); Metal matrix composites, Microstructure; Crystal structure; Plastic deformation; Impact; Focused ion beam (FIB)
Implementation of focused ion beam (FIB) system in characterization of nuclear fuels and materials
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Nuclear materials; Contamination; Radioactivity;
Lithium dendrite and solid electrolyte interphase investigation using OsO4
Keywords: پرتو یون متمرکز (FIB); Solid electrolyte interphase (SEI); Lithium deposition; Lithium ion batteries; Focused ion beam (FIB); Osmium tetroxide (OsO4) staining
Micropillar compression deformation of single crystals of the intermetallic compound ζ-FeZn13
Keywords: پرتو یون متمرکز (FIB); Intermetallic compounds; Plastic deformation; Dislocation structures; Focused ion beam (FIB); Transmission electron microscopy (TEM)
Quantification of double-layer Ni/YSZ fuel cell anodes from focused ion beam tomography data
Keywords: پرتو یون متمرکز (FIB); SOFC; Ni/YSZ anode; Focused ion beam (FIB); Microstructure reconstruction; Segmentation algorithm; Voxel
Effect of micro-droplets on the local residual stress field in CAE-PVD thin coatings
Keywords: پرتو یون متمرکز (FIB); Residual stress; Thin coating; Droplet; Focused ion beam (FIB); Digital image correlation (DIC);
Three-dimensional chemical analysis of laser-welded NiTi-stainless steel wires using a dual-beam FIB
Keywords: پرتو یون متمرکز (FIB); Intermetallic phases; Laser welding; Focused ion beam (FIB); Energy dispersive X-ray spectrometry (EDS); 3-D image analysis;
The study of Ga+ FIB implanting crystal silicon and subsequent annealing
Keywords: پرتو یون متمرکز (FIB); Focused ion beam (FIB); Silicon; Ion implantation; Annealing; Raman; XPS
Compression deformability of Γ and ζ Fe–Zn intermetallics to mitigate detachment of brittle intermetallic coating of galvannealed steels
Keywords: پرتو یون متمرکز (FIB); Compression test; Focused ion beam (FIB); Iron alloys; Multilayers; Plastic deformation
Deposition of metallic gallium on re-crystallized ceramic material during focused ion beam milling
Keywords: پرتو یون متمرکز (FIB); Deposition; Gallium; Epitaxial growth; Focused ion beam (FIB); Transmission electron microscopy (TEM);
Indentation fatigue of WC–Co cemented carbides
Keywords: پرتو یون متمرکز (FIB); Microindentation; Fatigue test; Focused ion beam (FIB); Transmission electron microscopy (TEM); Cermets
Influence of microstructural barriers on small fatigue crack growth in mild steel
Keywords: پرتو یون متمرکز (FIB); Fatigue; Small crack propagation; Electron backscatter diffraction (EBSD); Focused ion beam (FIB); Grain boundaries
Doping of TIPS-pentacene via Focused Ion Beam (FIB) exposure
Keywords: پرتو یون متمرکز (FIB); Doping; Focused Ion Beam (FIB); Scanning Kelvin Probe Microscopy; XPS; TIPS-pentacene
Characterization of multilayer nitride coatings by electron microscopy and modulus mapping
Keywords: پرتو یون متمرکز (FIB); Multilayer coatings; Electron Backscattered Diffraction (EBSD); Focused Ion Beam (FIB); Cross sectional Transmission Electron Microscopy (XTEM); Modulus mapping;