Structural effects of C60+ bombardment on various natural mineral samples-Application to analysis of organic phases in geological samples

► Organic phases trapped inside rocks may be accessed by ToF-SIMS depth profiling. ► To access the phases several micrometers of C60+ sputtering is needed. ► Sputtering induces topography and carbon deposition on the mineral surface. ► The topography is caused by chemical heterogeneities in the sample surface. ► The topography and carbon deposition do not affect the analysis of organic phases.