Dielectric and relaxation properties of thermally evaporated nanostructured bismuth sulfide thin films

► Understanding the electrical properties of semiconducting thin films is essential in device fabrication. In this study, we employed dielectric and relaxation analysis of nanocrystalline bismuth sulphide thin films. ► The information about the conduction of free charges under the application of an external electric field was explored using Al/BiSnc/Al structures. ► The inter-relationship between optical band gap energy and conduction properties of BiS thin films was explored. ► AC conductivity showed that the correlated barrier hopping model is the appropriate mechanism for the electron transport of BiS films. ► The results discussed in this report with necessary basic theoretical models were highly informative for understand the electrical properties of semiconducting thin films.