کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5356221 | 1388202 | 2015 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Interlayer interaction and Ï-band electron occupation on top layers of freshly cleaved bulk HOPG investigated with N(E) C KVV Auger electron spectroscopy
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موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
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چکیده انگلیسی
N(E) C KVV Auger spectra (V = ÏsÏpÏ) were used for measurement of the Ï-band electron occupation of five outer layers on freshly cleaved bulk HOPG. The Ï-band electron occupation of the 1-5 graphene layers was measured relative to the electron concentration in the Ïp-band. In-depth Ï-band profiles were obtained by means of variation of the Auger electron takeoff angle within the range of 15-90°. Differences in the Ï-band electron occupation of the 1-5 graphene layers were determined. The Ï-band electron occupation varies from 0 at the top graphene layer to that of the Ï-band electron occupation typical for bulk HOPG at the 5th graphene layer counted from the outer surface. These results are discussed on the basis of the Ï-band formation under the interlayer interaction of the pz-electrons.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 357, Part B, 1 December 2015, Pages 1434-1437
Journal: Applied Surface Science - Volume 357, Part B, 1 December 2015, Pages 1434-1437
نویسندگان
A.P. Dementjev, K.E. Ivanov, E.A. Tsyvkunova,