In-plane ordered grain boundaries inducing enhanced magnetoresistance in epitaxial manganite films

► La5/8Ca3/8MnO3 films with in-plane ordered grain boundaries were epitaxially grown on the yttria-stabilized zirconia (1 1 1) single crystal substrates. ► Structures of films were clarified definitely by X-ray diffraction measurements and schematics. ► Large MR over a broad temperature range was confirmed due to in-plane ordered grain boundaries and coupled with the film thickness.