کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5357324 1388215 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Effect of Young's modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
چکیده انگلیسی
Subjected to thermal cycling, the apparent Young's modulus of air plasma-sprayed (APS) 8 wt.% Y2O3-stabilized ZrO2 (8YSZ) thermal barrier coatings (TBCs) was measured by nanoindentation. Owing to the effects of sintering and porous microstructure, the apparent Young's modulus follows a Weibull distribution and changes from 50 to 93 GPa with an increase of thermal cycling. The evolution of residual stresses in the top coating of an 8YSZ TBC system was determined by X-ray diffraction (XRD). The residual stresses derived from the XRD data are well consistent with that obtained by the Vickers indention. It is shown that the evolution of Young's modulus plays an important role in improving the measurement precision of residual stresses in TBCs by XRD.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 256, Issue 23, 15 September 2010, Pages 7311-7315
نویسندگان
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