Microstructural evolution during nitriding, finite element simulation and experimental assessment

► FE simulation of nitriding is proposed, using the analogy between diffusion and conduction. ► Nitrided layer was characterized by OM, SEM observation, micro-hardness and XRD measurements. ► Diffusion zone is constituted by two different microstructures. ► Different residual stress and FWHM trends were found in the two parts of diffusion zone. ► Geometry dependency of layers growth and formation is captured by developed FE model.