کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5363482 | 1503696 | 2013 | 5 صفحه PDF | دانلود رایگان |

We report on an X-ray photoemission spectroscopy investigation of the early stages of growth of ultra-thin Cr films on the oxygen-passivated Fe(0Â 0Â 1)-p(1Â ÃÂ 1)O surface. The Cr coverages ranged from sub-monolayer up to a few atomic layers. Cr has been grown either at 380Â K or at 570Â K. Our investigation reveals that during the Cr film growth oxygen floats toward the free surface. The presence of a metallic Cr signal from the very beginning of film growth is discussed in relation to Cr-Fe intermixing and alloy formation at the interface. Our findings are independent from the growth temperature, indicating that it has a very little influence on the chemical interactions at the interface, at variance with the oxygen-free Cr/Fe interface.
⺠Oxygen aided growth of ultra-thin chromium films on Fe(0 0 1). ⺠Growth of the Cr films at different temperatures, namely 380 K and 570 K. ⺠Oxygen always segregates to the surface. ⺠Cr/Fe interfacial mixing is observed since the early stages of growth.
Journal: Applied Surface Science - Volume 267, 15 February 2013, Pages 141-145