Investigations of environmental induced effects on AlQ3 thin films by AFM phase imaging

Tris(8-hydroxyquinoline) metal complex (AlQ3) is a widely used light-emitting material in organic light emitting devices (OLEDs). The environmental stability is still a major problem with OLEDs and needs further improvement. In this report, an additional feature of Atomic Force Microscopy (AFM) was exploited with the aim to understand the environmental induced effects and physical phenomenon involved on AlQ3 thin films. We have used phase imaging to identify the presence of other aggregation phases formed after annealing the thin film in different ambient and after white light exposure. An enhanced photoluminescence intensity is observed for the samples annealed in oxygen near 100 °C. The enhanced photoluminescence is understood in terms of formation of a new aggregation phase. The phase change and the fraction of new phase is estimated by phase images taken by atomic force microscopy (AFM). Light induced effects on AlQ3 films exposed to white light in air and vacuum are characterized by atomic force microscopy (AFM) for surface morphology and phases present. The AFM images indicate enhanced crystallinity for the vacuum exposed samples. The phase with increased lifetime and hence enhanced crystallinity for vacuum exposed films has also been found by time correlated single photon counting (TCSPC) measurements. To the best of our knowledge, this study is applied for the first time on this material with the combination of topography and phase imaging in atomic force microscopy (AFM). The major aim was to take advantage of the additional feature of AFM-mode over the conventionally used.