کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5365764 | 1388337 | 2006 | 6 صفحه PDF | دانلود رایگان |
Thick crystalline zirconium oxide films were synthesized on Zircaloy-4 substrates by anodic oxidation at room temperature in NaOH solution with a stable applied voltage (300 V). The film is approximately 4.7 μm in thickness. The XPS and SEM analysis shows that the film is a three-layer structure in water, hydroxide and oxide parts. The thickness of that order is â¼0.01 μm, â¼1 μm, â¼3.7 μm, respectively. The oxide layer is composed of tetragonal and monoclinic phases with the volume ratio about 0.2. Furthermore, the thick anodic film acts as a barrier to oxygen and zirconium migrations. It effectively protects zirconium alloys against the worse corrosion. An extremely low passive current density of â¼0.018 μA/cm2 and a low oxidation weight gain of â¼0.411 mg/cm2 were also observed in the films.
Journal: Applied Surface Science - Volume 252, Issue 20, 15 August 2006, Pages 7436-7441