کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5367140 | 1388361 | 2007 | 5 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Ar+ irradiation of Si nanocrystal-doped SiO2: Evolution of photoluminescence Ar+ irradiation of Si nanocrystal-doped SiO2: Evolution of photoluminescence](/preview/png/5367140.png)
We report the evolution of photoluminescence (PL) of Si nanocrystals (nc-Si) embedded in a matrix of SiO2 during Ar+ ion bombardment. The integrated intensity of nc-Si PL falls down drastically before the Ar+ ion fluence of 1015 ions cmâ2, and then decreases slowly with the increasing ion fluence. At the meantime, the PL peak position blueshifts steadily before the fluence of 1015 ions cmâ2, and then changes in an oscillatory manner. Also it is found that the nc-Si PL of the Ar+-irradiated sample can be partly recovered after annealing at 800 °C in nitrogen, but can be almost totally recovered after annealing in oxygen. The results confirm that the ion irradiation-induced defects are made up of oxygen vacancies, which absorb light strongly. The oscillatory peak shift of nc-Si can be related to a size-distance distribution of nc-Si in SiO2.
Journal: Applied Surface Science - Volume 253, Issue 12, 15 April 2007, Pages 5501-5505