Nitrogen plasma-based ion implantation of poly(tetrafluoroethylene): Effect of the main parameters on the surface properties

The F/C atomic ratio determined by XPS strongly decreased, correlating inversely with voltage. The mean surface roughness characterized by topography measurements, increased, correlating directly with fluence and inversely with voltage. The wear volume obtained by multipass scratch tests did not show clear relationship with the main process parameters, however, it increased upon treatment with the increase of surface roughness and O/C atomic ratio. The water contact angle increased at low voltages and high fluences, due to preferential increase of roughness, and decreased at high voltages and low fluences, owing to intense defluorination and incorporation of N and O. The electrical resistance of the PBII-treated surfaces decreased by several orders of magnitude, showing a significant inverse correlation with fluence. It continued to decrease for samples exposed to air, primarily after treatments performed with low fluences, due to post-treatment type oxidation.