کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5368721 1388405 2006 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Structure and optical properties of ZnS thin films grown by glancing angle deposition
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Structure and optical properties of ZnS thin films grown by glancing angle deposition
چکیده انگلیسی

The glancing angle deposition (GLAD) technique was used to deposit ZnS films by electron beam evaporation method. The cross sectional scanning electron microscopy (SEM) image illustrated a highly orientated microstructure composed of slanted column. The atomic force microscopy (AFM) analysis indicated that incident flux angle had significant effects on the nodule size and surface roughness. Under identical nominal thickness, the actual thickness of the GLAD films is related to the incident flux angle. The refractive index and in-plane birefringence of the GLAD ZnS films were discussed, and the maximum birefringence Δn = 0.036 was obtained at incident flux angle of α = 80°. Therefore, the glancing angle deposition technique is a promising way to create a columnar structure with enhanced birefringent property.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 24, 15 October 2006, Pages 8734-8737
نویسندگان
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