کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5369439 | 1388433 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
AFM tip-induced ripple pattern on AIII-BV semiconductor surfaces
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موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: AFM tip-induced ripple pattern on AIII-BV semiconductor surfaces AFM tip-induced ripple pattern on AIII-BV semiconductor surfaces](/preview/png/5369439.png)
چکیده انگلیسی
Modification of c(8x2) InSb(0Â 0Â 1) surface induced by prolonged scanning with an atomic force microscope tip has been investigated. The experiment performed with loads of few tens of nanoNewtons resulted in creation of ripples perpendicular to the fast scan direction. It was found that terrace edges are acting as initial instabilities leading to development of the ripple pattern. As a result, information about initial surface topography is preserved in the ripple amplitude, even so the final height of the ripples and their periodicity are determined by the tip curvature.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 254, Issue 17, 30 June 2008, Pages 5431-5434
Journal: Applied Surface Science - Volume 254, Issue 17, 30 June 2008, Pages 5431-5434
نویسندگان
B. Such, F. Krok, M. Szymonski,