کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5423798 | 1395801 | 2009 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Low-energy electron diffraction structure determination of an ultrathin CoO film on Ag(0Â 0Â 1)
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The atomic structure of a four layer thick film of CoO on a Ag(0Â 0Â 1) substrate has been determined by comparing experimental low-energy electron diffraction (LEED) I(V) curves with multiple scattering calculations. The CoO film has been prepared using reactive evaporation of Co in an oxygen atmosphere leading to almost layer-by-layer growth. Contrary to the surface of CoO crystals an outward relaxation of the two outermost CoO layers as well as rumpling in the top layer has been found. The supposed driving force of this relaxation is the in-plane compressive stress, which results from the pseudomorphic growth of the CoO film on the Ag(0Â 0Â 1) substrate and the lattice mismatch of the two materials.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 603, Issue 16, 15 August 2009, Pages 2658-2663
Journal: Surface Science - Volume 603, Issue 16, 15 August 2009, Pages 2658-2663
نویسندگان
K.-M. Schindler, J. Wang, A. Chassé, H. Neddermeyer, W. Widdra,