Keywords: ساختار فیلم نازک; High head-to-tail regioregular poly(3-hexylthiophene); Grazing incidence X-ray diffraction; Thin film structure;
مقالات ISI ساختار فیلم نازک (ترجمه نشده)
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Influences of ultra-thin Ti seed layers on the dewetting phenomenon of Au films deposited on Si oxide substrates
Keywords: ساختار فیلم نازک; Dewetting; Crystallization; Thin film structure; XPS; Titanium; Gold;
Structure and morphology of epitaxially grown Fe3O4/NiO bilayers on MgO(001)
Keywords: ساختار فیلم نازک; Bilayer epitaxy; Magnetite; Nickel oxide; Magnesium oxide; Interface structure; Thin film structure; X-ray diffraction;
Annealing temperature dependence of the structures and properties of Co-implanted ZnO films
Keywords: ساختار فیلم نازک; Zinc oxide films; Magnetic films; Thin film structure; Ion-implantation;
Thin Co films with tunable ferromagnetic resonance frequency
Keywords: ساختار فیلم نازک; Ferromagnetic resonance; Thin magnetic films; Hysteresis loops; Thin film structure; TEM; Polycrystalline films;
The Influence of Ta underlayers on the structure of TiO2 thin films deposited on an unheated glass substrate
Keywords: ساختار فیلم نازک; Crystallization; Thin film structure; Sputtering processes; Titanium dioxides; Tantalum;
Transparent conductive ZnO:Al films grown by atomic layer deposition for Si-wire-based solar cells
Keywords: ساختار فیلم نازک; Zinc oxide II–VI semiconductors; Chemical vapor deposition; Atomic layer deposition; Thin film structure; Electrical properties; Solar cells
Ag surfactant effects of TiO2 films prepared by sputter deposition
Keywords: ساختار فیلم نازک; Crystal growth; Surfactant; Thin film structure; Sputtering; Processes; Titanium dioxides; Photocatalyst material
X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films
Keywords: ساختار فیلم نازک; X-ray photoelectron spectroscopy (XPS); Rare gas; Thin film structure
Correlating STM contrast and atomic-scale structure by chemical modification: Vacancy dislocation loops on FeO/Pt(1 1 1)
Keywords: ساختار فیلم نازک; Scanning tunneling microscopy; Surface electronic phenomena; Reduction; Iron; Oxides; Thin film structure; Moiré superstructure;
Low-energy electron diffraction structure determination of an ultrathin CoO film on Ag(0Â 0Â 1)
Keywords: ساختار فیلم نازک; Low-energy electron diffraction (LEED); Thin film structure; Metal-oxide interface; Cobalt oxide;
Investigation of microstructure evolution in Pt-doped TiO2 thin films deposited by rf magnetron sputtering
Keywords: ساختار فیلم نازک; 81.15.Cd; 78.30.Hv; 61.05.Câ; 68.55.âa; Sputtering; Raman spectra; XRD; Thin film structure;
Surface nano-structured silicon carbide thin film produced using hot filament decomposition of ethylene at low temperature on silicon wafer
Keywords: ساختار فیلم نازک; Diamond-like material; Silicon carbide; Thin film structure; Chemical vapor deposition;
Scanning tunneling microscopy study on a BC3 covered NbB2(0 0 0 1) surface
Keywords: ساختار فیلم نازک; Scanning tunneling microscopy; Scanning tunneling spectroscopy; Low energy electron diffraction; BC3; Honeycomb structure; Surface structure; Surface segregation; Thin film structure;
Alternate monatomic layer sputter deposition of FCT (L10-type) ordered FePt and CoPt films
Keywords: ساختار فیلم نازک; 81.15.Cd; 68.55.−a; 75.70.Ak; 75.60, 75.70.CnDeposition by sputtering; Thin film structure; Magnetic properties of monolayers and thin films; Superlattices
The epitaxial sexiphenyl (0 0 1) monolayer on TiO2(1 1 0): A grazing incidence X-ray diffraction study
Keywords: ساختار فیلم نازک; Organic epitaxy; Thin film structure; Grazing incidence X-ray diffraction; Atomic force microscopy;
Mechanism of biaxial alignment in thin films, deposited by magnetron sputtering
Keywords: ساختار فیلم نازک; 81.15.Aa; 68.55.Jk; 81.15.CdMagnetron sputtering; Thin film structure; Growth model; Biaxial alignment; Preferential orientation
Study of the structure and phase composition of nanocrystalline silicon oxynitride films synthesized by ICP-CVD
Keywords: ساختار فیلم نازک; 41.60.Ap; 68.55.Nq; XRD using synchrotron radiation; Thin film structure; Silicon oxynitride;