کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
542419 | 871553 | 2006 | 7 صفحه PDF | دانلود رایگان |

This paper describes the methods and experimental techniques for determination of the metastability behavior of the flip–flops used in the programmable digital circuits. A dual model of the metastability distinguishes two transitions at the flip–flop output (L/H and H/L) which have different impact on the Mean Time Between Failures (MTBF) of the flip–flop. A new circuit of the late transition detector (LTD) allows for determination of the pairs of the metastability parameters, the window W and the time constant τ, for both transitions. The test results are presented for four types of programmable digital circuits fabricated commercially in CMOS technology. In the all tests, the H/L transition clearly dominates with respect to MTBF (as a worse one). The presented test methods can also be used for evaluation of flip–flops in nonprogrammable digital circuits.
Journal: Microelectronics Journal - Volume 37, Issue 2, February 2006, Pages 174–180