کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5425082 1395847 2008 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Surface structure of Si(1 1 1)-(8 Ã— 2)-In determined by reflection high-energy positron diffraction
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Surface structure of Si(1 1 1)-(8 Ã— 2)-In determined by reflection high-energy positron diffraction
چکیده انگلیسی

By using reflection high-energy positron diffraction (RHEPD) and first-principles calculations, we investigated an In/Si(1 1 1) surface on which the quasi-one-dimensional In atomic chains that exhibit the metal-insulator transition were formed. From the analyses of rocking curves, we found the transformation of the zigzag chain structure of In atomic chains to hexagon structures below 130 K along with the phase transition from the 4 × 1 to the 8 × 2 periodicities. The band structure calculated with the optimum hexagon structure displays the gap opening of 60 meV, which indicates the semiconducting character. This confirms the recent theoretical prediction that the hexagon structure is energetically favored at low temperatures [C. González, F. Flores, J. Ortega, Phys. Rev. Lett. 96 (2006) 136101].

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 602, Issue 14, 15 July 2008, Pages 2448-2452
نویسندگان
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