کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5425156 1395848 2007 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Interaction of cesium with charged oxide under UV irradiation imaged by photoemission electron microscopy
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Interaction of cesium with charged oxide under UV irradiation imaged by photoemission electron microscopy
چکیده انگلیسی

We report the first observation of electron transfer from charged SiO2/Si(1 0 0) by ion-implantation via internal photoemission from Si by photoemission electron microscopy (PEEM) for the purpose of the microscopic control of promotion of catalyst by electron transfer from oxide support. The contrast of the PEEM image varies with the amount and kind of the implanted ion and the deposition of Cs through the formation of electrical double layer consisting of Cs+ and trapped electrons at trapping centers created by the implantation. It is then firmly established that oxide charging can be microscopically tuned by ion-implantation.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 601, Issue 22, 15 November 2007, Pages 5309-5312
نویسندگان
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