Keywords: اکسید سیلیکون; Copper oxides; Aluminum silicates; Silicon oxides; Ammonia; Catalytic combustion;
مقالات ISI اکسید سیلیکون (ترجمه نشده)
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Effect of air on debris formation in femtosecond laser ablation of crystalline Si
Keywords: اکسید سیلیکون; Femtosecond laser; Micromachining; Ablation; Axicon; Debris; Silicon oxides; Nanoparticle; Silicon;
Surface structure determination of silica single layer on Mo(112) by LEED
Keywords: اکسید سیلیکون; Low energy electron diffraction (LEED); Molybdenum; Silicon oxides;
Low energy alkali ion scattering investigation of Au nanoclusters grown on silicon oxide surfaces
Keywords: اکسید سیلیکون; Low energy ion scattering (LEIS); Ion-solid interactions; Gold; Silicon; Silicon oxides; Nanoclusters;
SEM/EDS study of metal-assisted oxide desorption
Keywords: اکسید سیلیکون; Scanning electron microscopy; Silicon oxides; Thermal desorption; Electron-stimulated desorption; Ellipsometry; Sputter deposition;
Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns
Keywords: اکسید سیلیکون; Semiconductor-insulator interfaces; Semiconductor-semiconductor thin film structures; Silicon oxides; Photoelectron emission; Synchrotron radiation photoelectron spectroscopy; Photoelectron emission microscopy (XPEEM);
Ellipsometric characterization of SiOx films with embedded Si nanoparticles
Keywords: اکسید سیلیکون; Vacuum evaporation; Silicon oxides; nc-Si clusters; Spectral ellipsometry and modelling; Atomic-force microscopy
Pentacene islands grown on ultra-thin SiO2
Keywords: اکسید سیلیکون; Scanning tunneling microscopy; Nanotechnology; Pentacene; Ultra-thin oxide; Silicon oxides; Organic semiconductors; Roughness;
Band alignment of SiO2/Si structure formed with nitric acid vapor below 500 °C
Keywords: اکسید سیلیکون; Oxidation; Silicon; Silicon oxides; Semiconductor-insulator interfaces; X-ray photoelectron spectroscopy; Insulating films; Metal-oxide-semiconductor; Nitric acid;
A kinetic Monte Carlo study of the initial stage of silicon oxidation: Basic mechanisms-induced partial ordering of the oxide interfacial layer
Keywords: اکسید سیلیکون; Crystalline-amorphous interfaces; Growth; Silicon oxides; Monte Carlo simulations;
Structure of CF4 multilayers on (0 0 0 1) surfaces of graphite and hydroxylated α-quartz: A molecular dynamics study
Keywords: اکسید سیلیکون; Computer simulations; Molecular dynamics; Physical adsorption; Surface structure; Silicon oxides;
Theoretical investigation of van der Waals forces between solid surfaces at nanoscales
Keywords: اکسید سیلیکون; Semi-empirical models and model calculations; van der Waals force; Sticking; Silicon; Silicon oxides; Surface structure, morphology, roughness, and topography;
Use of tin as a surfactant material for the growth of thin silver films on silicon oxide
Keywords: اکسید سیلیکون; Silver; Tin; Silicon oxides; Sputter deposition; Growth;
Effect of Si nanoparticles embedded in SiOx on optical properties of the films studied by spectroscopic ellipsometry and photoluminescence spectroscopy
Keywords: اکسید سیلیکون; 42.70.âa; 81.07.âb; 78.67.ân; 78.67.Bf; Vacuum evaporation; Silicon oxides; Nanocrystalline Si clusters; Spectral ellipsometry; Photoluminescence properties;
Germanium interactions with Si-etched silicon dioxide
Keywords: اکسید سیلیکون; Hot-wire chemical vapor deposition; X-ray photoelectron spectroscopy; Temperature programmed desorption; Etching; Surface chemical reaction; Germanium; Silicon oxides; Defects;
Ionization of xenon Rydberg atoms at oxidized Si(1Â 0Â 0) surfaces
Keywords: اکسید سیلیکون; Field ionization; Ion-solid interactions; Surface electronic phenomena; Silicon; Silicon oxides; Single crystal surfaces; Insulating surfaces; Semiconducting surfaces;
Density functional theory studies of submonolayer oxidized silicon structures on Pd(1 1 1) and Pt(1 1 1)
Keywords: اکسید سیلیکون; Density functional calculations; Palladium; Platinum; Silicon; Silicon oxides; Metal-insulator interfaces;
Real-time monitoring of SiO2/Si(1 1 1) interlayer etching by Brewster-angle reflectometry
Keywords: اکسید سیلیکون; Computer simulations; Atomic force microscopy; Synchrotron radiation photoelectron spectroscopy; Reflection spectroscopy; Electrochemical methods; Etching; Physical adsorption; Surface roughening; Silicon; Silicon oxides; Solid-liquid interfaces; Semico
Tip-induced large-area oxide bumps and composition stoichiometry test via atomic force microscopy
Keywords: اکسید سیلیکون; Atomic force microscopy (AFM); Backscattered electron image; Energy dispersive X-ray spectrometer (EDS); Oxidation; Silicon oxides; Stoichiometric composition;
Interaction of cesium with charged oxide under UV irradiation imaged by photoemission electron microscopy
Keywords: اکسید سیلیکون; Photoemission electron microscopy; Ion-implantation methods; Catalysis; Silicon oxides; Cesium;
Oxide-assisted growth of silicon nanowires by carbothermal evaporation
Keywords: اکسید سیلیکون; Evaporation and sublimation; Silicon; Carbon; Silicon oxides; Nanostructures;
Photo-modification and synthesis of semiconductor nanocrystals
Keywords: اکسید سیلیکون; Raman scattering spectroscopy; Oxidation; Crystallization; Silicon; Silicon oxides; Nanostructures; Photosynthesis; Photo-oxidation;
Determining adhesion and hermeticity of the interface between encapsulation polymer and insulating layer of micro-sensing chips via a capacitance–voltage technique
Keywords: اکسید سیلیکون; Adhesion; Sensors; Interfaces; Silicon oxides
Combined AFM and Brewster-angle analysis of gradually etched ultrathin SiO2 - Comparison with SRPES results
Keywords: اکسید سیلیکون; Atomic force microscopy; Synchrotron radiation photoelectron spectroscopy; Reflection spectroscopy; Dielectric phenomena; Etching; Surface structure, morphology, roughness and topography; Silicon; Silicon oxides;
Formation of atomically smooth SiO2/SiC interfaces at â¼120 °C by use of nitric acid oxidation method
Keywords: اکسید سیلیکون; SiC; Nitric acid oxidation; Low temperature oxidation; Silicon oxides; Insulating films; NAOS;
In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO2 substrates
Keywords: اکسید سیلیکون; Pentacene; In-situ characterization; Atomic force microscopy; Near edge extended X-ray absorption fine structure (NEXAFS); Surface structure, morphology, roughness and topography; Silicon oxides; Aromatics; Thin film structures;
Formation of 10-30 nm SiO2/Si structure with a uniform thickness at â¼120 °C by nitric acid oxidation method
Keywords: اکسید سیلیکون; Scanning transmission electron microscopy; X-ray photoelectron spectroscopy; Oxidation; Silicon; Silicon oxides; Polycrystalline thin films; Insulating films; Semiconductor-insulator interfaces;
Characterization of ion species of silicon oxide films using positive and negative secondary ion mass spectra
Keywords: اکسید سیلیکون; Silicon oxides; Secondary ion species; Time-of-flight secondary ion mass spectrometry;
Small silicon-oxygen dianions in the gas phase
Keywords: اکسید سیلیکون; Dianions; Mass spectrometry; Ab initio calculations; Silicon oxides;
Hydrogen related point defects in silicon based layers: Si(·)H and SiOOH
Keywords: اکسید سیلیکون; Silicon oxides; Surface defects; Pulsed laser ablation; Infrared spectroscopy;
X-ray photoelectron spectroscopy characterization of oxidated Si particles formed by pulsed ion-beam ablation
Keywords: اکسید سیلیکون; Silicon oxides; Pulsed ion-beam evaporation; Ablation plasma; X-ray photoelectron spectroscopy;
Ablation of silica glass using pulsed laser plasma soft X-rays
Keywords: اکسید سیلیکون; Laser methods; X-ray absorption spectroscopy; Desorption induced by photon stimulation; Surface melting; Silicon oxides; Glass surfaces; Single crystal surfaces;
Surface modification of nano-SiO2 particles using polyaniline
Keywords: اکسید سیلیکون; Polyaniline; Silicon oxides; Conductivity; Interface;
Reaction mechanisms of oxygen at SiO2/Si(1Â 0Â 0) interface
Keywords: اکسید سیلیکون; Density functional calculations; Oxidation; Silicon; Silicon oxides; Semiconductor-insulator interfaces;
XPS and SIMS investigation on the role of nitrogen in Si nanocrystals formation
Keywords: اکسید سیلیکون; Chemical vapor deposition; Photoelectron spectroscopy; Secondary ion mass spectrometry; Oxidation; Nitrogen atom; Silicon oxides; Clusters; Insulating films; Si-nanocrystals;
XPS with fast-frozen samples: A renewed approach to study the real mineral/solution interface
Keywords: اکسید سیلیکون; Soft X-ray photoelectron spectroscopy; Solid-liquid interfaces; Interface potential; Silicon oxides; Gibbsite; Goethite; Manganite;
UHV-MOCVD growth of TiO2 on SiOx/Si(1Â 1Â 1): Interfacial properties reflected in the Si 2p photoemission spectra
Keywords: اکسید سیلیکون; Synchrotron radiation photoelectron spectroscopy; Titanium oxide; Silicon oxides; Chemical vapour deposition; Semiconductor-insulator interfaces; Growth; Amorphous thin films; Models of surface kinetics;