کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9595555 1395941 2005 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
XPS with fast-frozen samples: A renewed approach to study the real mineral/solution interface
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
XPS with fast-frozen samples: A renewed approach to study the real mineral/solution interface
چکیده انگلیسی
The Na/Cl atomic ratio (frozen samples) allows determination of the pH range where the mineral surface charge is close to zero. This ratio can be used also to prove an ion pair formation at the surface. From the intensity of the O 1s component corresponding to water, an interface thickness of 0.5 nm was estimated. A “built-in” potential at the interface, evincing as matrix elements photoelectron lines shifts after water loss, was found. This potential arises due to the spatial separation of the charged mineral surface and counter-ions in the electrical double layer (EDL). Its value does not exceed 250 mV and the sign depends on the charge of the mineral surface.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 584, Issue 1, 10 June 2005, Pages 106-112
نویسندگان
, ,