کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5426223 | 1395883 | 2007 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Si(1 1 1)-H(1 Ã 1): A mirror for atoms characterized by AFM, STM, He and H2 diffraction
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Si(1 1 1)-H(1 Ã 1): A mirror for atoms characterized by AFM, STM, He and H2 diffraction Si(1 1 1)-H(1 Ã 1): A mirror for atoms characterized by AFM, STM, He and H2 diffraction](/preview/png/5426223.png)
چکیده انگلیسی
AFM, STM and diffraction of He and H2 have been used to assess Si(1Â 1Â 1)-H(1Â ÃÂ 1) surfaces for their potential as mirrors for matter-waves. The H-passivated samples are produced by wet-chemical methods and delivered to a different laboratory for diffraction measurements. We show that the surface is flat and homogenous over lateral scales of microns and that absolute He and H2 reflectivities of the order of â¼3% are obtained, even after 20Â h storage under Ar and several days' storage in UHV. These characteristics allow the use of Si(1Â 1Â 1)-H(1Â ÃÂ 1) as a highly reflective mirror for atoms and molecules, with application in a future He microscope or focused hydrogen nano-lithography system.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 601, Issue 1, 1 January 2007, Pages 24-29
Journal: Surface Science - Volume 601, Issue 1, 1 January 2007, Pages 24-29
نویسندگان
D. Barredo, F. Calleja, A.E. Weeks, P. Nieto, J.J. Hinarejos, G. Laurent, A.L. Vazquez de Parga, D.A. MacLaren, D. FarÃas, W. Allison, R. Miranda,