Highly stable field emission properties from well-crystalline 6-Fold symmetrical hierarchical ZnO nanostructures

Herein, we report the growth, characterization and field emission application of well-crystalline 6-fold symmetrical hierarchical ZnO nanostructures grown on silicon substrate by thermal evaporation process. The detailed morphological characterizations revealed that the prepared material possess six-fold structures in which ZnO nanoneedles are symmetrically grown on each facets of core hexagonal ZnO nanorods in such a manner that they made beautiful 6-fold symmetrical hierarchical structure. The detailed structural studies confirmed that the grown hierarchical structures possess well-crystallinity with wurtzite hexagonal phase. The room-temperature photoluminescence (PL) spectrum exhibited a strong UV emission confirming good optical properties. The Raman-scattering revealed the wurtzite hexagonal phase for as-grown hierarchical structures. The field emission properties of the 6-fold symmetrical hierarchical ZnO nanostructures were tested and a turn-on voltage equal to 2.8 kV, corresponds to emission current of 65 nA, was observed. A threshold voltage of 4.6 kV with a maximum emission current of about 9.36 µA was also recorded. A high emission current stability profile over a period of ~7000 s was noted for the fabricated FE device.