Development of anorthite based white porcelain glaze without ZrSiO4 content

The microstructure and structure of the glazes were measured with the use of a Scanning Electron Microscope (SEM) and X-ray Diffraction (XRD). The colour and gloss of glazes were measured with the use of a spectrophotometer and a gloss metre at a 60° angle of incidence. The topography of glazes surfaces, as well as the roughness level (Ra), were measured with the use of a confocal microscope.