کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5438554 | 1398185 | 2017 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Comparative study on dielectric behavior in fresh and aged Na0.5Bi0.5(Ti,Fe,W)O3 thin films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Na0.5Bi0.5(Ti0.90Fe0.02W0.08)O3 (NBTFW) thin film was deposited on the ITO/glass substrate by chemical solution deposition. Microstructure, insulating and dielectric performances were measured and compared in fresh and aged samples. Both samples crystallize into phase-pure perovskite structures and possess smooth surfaces without any cracks. Lower leakage current density and relative dielectric constant can be obtained in aged NBTFW film compared to those for fresh one. At low voltage or high frequency, the fresh film exhibits a typical butterfly pattern of normalized dielectric constant-electric field curve, while the aged film shows an abnormal characteristic with two normal double-peaks shape. The related aging mechanism is discussed to be associated with the realignment of VOâ
â
âFeTiâ² defect dipoles along the spontaneous polarization via the migration of mobile oxygen vacancies.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ceramics International - Volume 43, Issue 10, July 2017, Pages 7690-7694
Journal: Ceramics International - Volume 43, Issue 10, July 2017, Pages 7690-7694
نویسندگان
Changhong Yang, Jiaqian Sun, Zhaode Yi, Yuyu Yao, Xiushan Sun,