کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
544055 871703 2006 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Alloy splitting of Te-DX in AlxGa1−xAs analysis using the deep level transient spectroscopy technique
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Alloy splitting of Te-DX in AlxGa1−xAs analysis using the deep level transient spectroscopy technique
چکیده انگلیسی

The paper reports on a deep level transient spectroscopy analysis of Te-related DX centers in AlxGa1−xAs with aluminum composition x=0.40. As was shown from experimental results, the state energy of this trap shows a microscopic structure due to an alloy effect. A theoretical analysis based on a multi-step scheme has been made to explain the electron emission from a multiconfigurate center. Using this model, we derived the binding energies of the splitted Te-DX states in the alloy material studied.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Journal - Volume 37, Issue 7, July 2006, Pages 586–590
نویسندگان
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