Thermally evaporated AgyCu2-ySnSe3 metal chalcogenide thin films and its characterization

AgyCu2-ySnSe3 thin films were prepared for four different Ag/Cu + Ag ratios (12.5%, 25%, 37.5% and 50%) by thermal vacuum evaporation technique. The XRD and HRTEM analysis assured the incorporation of Ag within the system. EDAX analysis confirmed the stoichiometric ratio of the compound. All the Ag incorporated thin films showed higher optical absorption than the Cu2SnSe3 thin film and their band gap values were found in the range of 1.93-1.63eV. The resistivity of AgyCu2-ySnSe3 thin films is much lesser than other silver based quaternary compounds such as CuAgGeSe3 and Cu0.5Ag0.5InSe2.