کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5443718 1510876 2017 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ions
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ions
چکیده انگلیسی
Sample geometries for micro-mechanical testing, e.g. micro-pillars and micro-cantilevers are primarily produced using gallium focused ion beam technology. However, the effects of the gallium ions on the mechanical properties of metals which are embrittled by liquid metal gallium are still unknown. In this work, micro-compression samples from single crystalline and ultrafine-grained aluminum are fabricated using both xenon and/or gallium ions. The different ions have little effect on the yield strength of single crystalline aluminum. However, for the ultrafine-grained aluminum, the strength is reduced with increasing Ga dose, and considerable differences in the deformation morphology and resulting microstructures are observed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 127, 15 January 2017, Pages 191-194
نویسندگان
, , , , , , , , ,