کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5449482 1512530 2017 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Dispersion-enhanced third-harmonic microscopy
ترجمه فارسی عنوان
میکروسکوپ ثانویه هارمونیک تقویت شده با پراکندگی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
چکیده انگلیسی
We demonstrate strong enhancements of signal yield and image contrast in third-harmonic microscopy by appropriate choice of driving laser wavelength to modulate the phase-matching conditions of the conversion process by dispersion control. Tuning the laser wavelength in the range of 1010 - 1350 nm at samples containing interfaces with water and glass, we obtained large signal enhancements up to a factor of 19, and improvements in the image contrast by an order of magnitude. The effect is most pronounced at interfaces with media of small and/or not too different nonlinear optical susceptibilities, e.g., as it is the case in typical samples in harmonic microscopy. Beyond the demonstration of this new variant of third-harmonic microscopy, our findings are also of relevance to a proper choice of laser systems for harmonic microscopy setups.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 393, 15 June 2017, Pages 289-293
نویسندگان
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