کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
545455 | 1450554 | 2009 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Comparison and evaluation of newest failure rate prediction models: FIDES and RIAC 217Plus
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
The failure rate of an example avionics control unit with approximately 7000 electronic components is calculated with the latest state-of-the-art prediction models FIDES Guide 2004 and RIAC-Handbook-217Plus (2006). To allow comparison of the component prediction models a standard civil avionics profile was defined and used for both calculations. Results are compared supported by analysis of the influence of component and application specific parameters such as temperature, temperature cycles, humidity, and vibration. In addition predicted failure rates are compared to field data that has been collected for this unit during 15 years.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 49, Issues 9–11, September–November 2009, Pages 967–971
Journal: Microelectronics Reliability - Volume 49, Issues 9–11, September–November 2009, Pages 967–971
نویسندگان
Marcel Held, Klaus Fritz,