Percolation theory applied to PZT thin films capacitors breakdown mechanisms

Time-Dependent Dielectric Breakdown (TDDB) mechanisms remain the key issue to understand in order to enhance the reliability of new capacitors technologies. In this work we tried to model capacitors failure mechanism according to percolation theory, in agreement with the statistical behavior of PZT capacitors times to breakdown (tbd). The role of microstructural defects such as interlayers and cavities in failure mechanism has been emphasized.