کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
545508 | 1450554 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Evaluation of AlGaInP LEDs reliability based on accelerated tests
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
High efficiency LEDs are replacing incandescent bulbs in many applications particularly those requiring durability and low power consumption. In some of these applications, as automotive and traffic signals, LEDs work in outdoor environment and in some cases in extreme temperature and humidity conditions. Main failure mechanisms have been identified for the different stress conditions (temperature/humidity accelerated tests). MTTF of 127,000 h have been evaluated for real working conditions by means of applying Arrhenius and Peck model values obtained in this paper.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 49, Issues 9–11, September–November 2009, Pages 1240–1243
Journal: Microelectronics Reliability - Volume 49, Issues 9–11, September–November 2009, Pages 1240–1243
نویسندگان
E. Nogueira, M. Vázquez, N. Núñez,