کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
546049 | 871864 | 2012 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The thermally induced limitations of SiC SBDs operation conditions
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
In the paper, the DC current–voltage characteristics of silicon carbide Schottky barrier diodes are analyzed, with special attention paid to the critical current and junction temperature estimation. The self-heating phenomenon, interpreted as an electro-thermal positive feedback, is taken into account. The measurements of isothermal and non-isothermal I–V characteristics, as well as adequate calculations, are shown and discussed. The electro-thermal models, based on various descriptions of temperature-dependent series resistance of the device, are proposed. It is also shown that the shapes of I–V characteristics depend on the current range and on the heat-sink size.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Journal - Volume 43, Issue 9, September 2012, Pages 656–660
Journal: Microelectronics Journal - Volume 43, Issue 9, September 2012, Pages 656–660
نویسندگان
WŁodzimierz Janke, Aneta Hapka,