کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
546370 | 871890 | 2010 | 12 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Via wearout detection with on-chip monitors
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Via wearout detection with on-chip monitors Via wearout detection with on-chip monitors](/preview/png/546370.png)
چکیده انگلیسی
This project aims to detect the onset of chip failure due to via voiding through monitoring the delays of paths in a chip. The proposed method relates the probability of failure of individual vias to an increase in delay for monitors of the system using data for 65 nm technology. The delay increase, as a function of the failure distribution parameters, the path length, gate type, and process variation, has been investigated. An on-chip, ring oscillator-based wearout monitoring circuit is presented. The proposed scheme monitors the delay through a data path using a delay detection circuit (DDC).
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Journal - Volume 41, Issue 11, November 2010, Pages 789–800
Journal: Microelectronics Journal - Volume 41, Issue 11, November 2010, Pages 789–800
نویسندگان
Fahad Ahmed, Linda Milor,