Probing the deformation and fracture properties of Cu/W nano-multilayers by in situ SEM and synchrotron XRD strain microscopy

Probing the deformation and fracture properties of Cu/W nano-multilayers by in situ SEM and synchrotron XRD strain microscopy

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 320, 25 June 2017, Pages 158-167

León Romano Brandt, Enrico Salvati, Chrysanthi Papadaki, Hongjia Zhang, Siqi Ying, Eric Le Bourhis, Igor Dolbnya, Tan Sui, Alexander M. Korsunsky,