Fully digital strategy for fast calibration and test of ΣΔ ADCs

This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution ΣΔ ADCs. Simulation results showed a detection sensitivity on specifications parameters of up to −100 dB. The proposed method can also help to reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration.