کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5466632 | 1518295 | 2018 | 19 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Multiple beam ptychography for large field-of-view, high throughput, quantitative phase contrast imaging
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The ability to record large field-of-view images without a loss in spatial resolution is of crucial importance for imaging science. For most imaging techniques however, an increase in field-of-view comes at the cost of decreased resolution. Here we present a novel extension to ptychographic coherent diffractive imaging that permits simultaneous full-field imaging of multiple locations by illuminating the sample with spatially separated, interfering probes. This technique allows for large field-of-view imaging in amplitude and phase while maintaining diffraction-limited resolution, without an increase in collected data i.e. diffraction patterns acquired.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 184, Part A, January 2018, Pages 164-171
Journal: Ultramicroscopy - Volume 184, Part A, January 2018, Pages 164-171
نویسندگان
Charles Bevis, Robert Jr., Jonathan Reichanadter, Dennis F. Gardner, Christina Porter, Elisabeth Shanblatt, Michael Tanksalvala, Giulia F. Mancini, Henry Kapteyn, Margaret Murnane, Daniel Adams,