کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5466696 1518297 2017 13 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Origin of atomic displacement in HAADF image of the tilted specimen
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Origin of atomic displacement in HAADF image of the tilted specimen
چکیده انگلیسی
The effect of the tilt of the crystallographic orientation with respect to an incident electron probe on high-angle annular dark field (HAADF) imaging in aberration-corrected scanning transmission electron microscopy (STEM) is investigated in experiment and simulation. A small specimen tilt can lead to unequal deviations of different atom species in the HAADF image and result in further relative displacement between anion and cation. Simulated HAADF images also confirm that the crystal tilt causes an artifact in atom polarization. The effect is derived from the scattering abilities of different atoms.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 182, November 2017, Pages 156-162
نویسندگان
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