Modeling of ionizing radiation effect on optoelectronic-integrated devices (OEIDs)

The ionizing radiation effect on the static and dynamic behavior of an optoelectronic-integrated device composed of a hetrojunction phototransistor and light-emitting diode is studied theoretically. First, the device characteristics before irradiation are investigated based on the equivalent circuit of the constituent devices and the optical feedback inside the device. Second, the effect of neutron irradiation flux on transient behavior of this device is theoretically studied. It was noticed that, the neutron irradiation flux reduces the transient response in both the amplification and switching modes. Also, neutron irradiation flux increases the switching voltage of the device and decreases the output current, this means that the ON state device which exposed to this irradiation flux will turn to the OFF state because it will need higher value of switching voltage. Either increasing the amount of input light or the applied voltage is required to turn the device to the ON state again. This type of models can be exploited as optical amplifier, optical switching device and other applications.