Test of Ultra Fast Silicon Detectors for picosecond time measurements with a new multipurpose read-out board

Ultra Fast Silicon Detectors (UFSD) are sensors optimized for timing measurements employing a thin multiplication layer to increase the output signal. A multipurpose read-out board hosting a low-cost, low-power fast amplifier was designed at the University of Kansas and tested at the European Organization for Nuclear Research (CERN) using a 180  GeV pion beam. The amplifier has been designed to read out a wide range of detectors and it was optimized in this test for the UFSD output signal. In this paper we report the results of the experimental tests using 50  μm thick UFSD with a sensitive area of 1.4mm2. A timing precision below 30  ps wasachieved.