کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
551568 872881 2006 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Improving test quality using robust unique input/output circuit sequences (UIOCs)
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر تعامل انسان و کامپیوتر
پیش نمایش صفحه اول مقاله
Improving test quality using robust unique input/output circuit sequences (UIOCs)
چکیده انگلیسی

In finite state machine (FSM) based testing, the problem of fault masking in the unique input/output (UIO) sequence may degrade the test performance of the UIO based methods. This paper investigates this problem and proposes the use of a new type of unique input/output circuit (UIOC) sequence for state verification, which may help to overcome the drawbacks that exist in the UIO based techniques. When constructing a UIOC, overlap and internal state observation schema are used to increase the robustness of a test sequence. Test quality is compared by using the forward UIO method (F-method), the backward UIO method (B-method) and the UIOC method (C-method) separately. Robustness of the UIOCs constructed by the algorithm given in this paper is also compared with those constructed by the algorithm given previously. Experimental results suggest that the C-method outperforms the F- and the B-methods and the UIOCs constructed by the algorithm given in this paper, are more robust than those constructed by other proposed algorithms.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Information and Software Technology - Volume 48, Issue 8, August 2006, Pages 696–707
نویسندگان
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