کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
555873 1451260 2016 15 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Area-to-point regression kriging for pan-sharpening
ترجمه فارسی عنوان
کریجینگ رگرسیون به نقطه برای پان تیز کردن
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سیستم های اطلاعاتی
چکیده انگلیسی

Pan-sharpening is a technique to combine the fine spatial resolution panchromatic (PAN) band with the coarse spatial resolution multispectral bands of the same satellite to create a fine spatial resolution multispectral image. In this paper, area-to-point regression kriging (ATPRK) is proposed for pan-sharpening. ATPRK considers the PAN band as the covariate. Moreover, ATPRK is extended with a local approach, called adaptive ATPRK (AATPRK), which fits a regression model using a local, non-stationary scheme such that the regression coefficients change across the image. The two geostatistical approaches, ATPRK and AATPRK, were compared to the 13 state-of-the-art pan-sharpening approaches summarized in Vivone et al. (2015) in experiments on three separate datasets. ATPRK and AATPRK produced more accurate pan-sharpened images than the 13 benchmark algorithms in all three experiments. Unlike the benchmark algorithms, the two geostatistical solutions precisely preserved the spectral properties of the original coarse data. Furthermore, ATPRK can be enhanced by a local scheme in AATRPK, in cases where the residuals from a global regression model are such that their spatial character varies locally.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: ISPRS Journal of Photogrammetry and Remote Sensing - Volume 114, April 2016, Pages 151–165
نویسندگان
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