The early stages of Saccharomyces cerevisiae yeast suspensions damage in moderate pulsed electric fields

The objectives of this study were to investigate the effects of pulsed electric fields (PEF) application to colloidal suspension of Saccharomyces cerevisiae. The electrical conductivity measurements during the PEF-treatment of S. cerevisiae suspensions were used to monitor the extent of cell damages in the intervals of electric field strength E = 3–15 kV/cm and time of PEF treatment tPEF = 10−4 to 1 s. At relatively small fields (E < 7.5 kV/cm) the early stages of yeast cells damages were observed. At such treatment conditions, the damage was incomplete and developed at long time of PEF treatment, below the value of E = 7.5 kV/cm which is commonly referred in literature as a threshold for this culture. Data obtained for the disintegration in conductivity experiments were found in good correlation with direct counting of yeast lethality using light microscopy. The PEF-induced lethality of the yeast cells and size flocs increased with the mixing of suspensions and the increase of temperature.