کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
692695 889849 2012 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Using X-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings
موضوعات مرتبط
مهندسی و علوم پایه مهندسی شیمی تکنولوژی و شیمی فرآیندی
پیش نمایش صفحه اول مقاله
Using X-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings
چکیده انگلیسی

Model paint materials were generated by adding a range of inorganic materials into an epoxy. The inorganic materials included inhibitors (Zn3(PO4)2 and SrCrO4) and a filler (rutile TiO2).The SrCrO4 system was characterized using SEM, TEM, PALS and Raman spectroscopy and found to have an even distribution of inhibitor in the polymer matrix. X-ray tomography was performed on the mixed SrCrO4/TiO2 and Zn3(PO4)2/TiO2 systems. A new technique called data constrained modelling was combined with the tomographic technique to produce a 3D distribution of the inorganic phases within the polymer matrix.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Progress in Organic Coatings - Volume 74, Issue 4, August 2012, Pages 726–733
نویسندگان
, , , , , , , , ,