Correlation between irregular surface geometry and certain electrochemical quantities in poly-ortho-aminophenol

The relationship between the fractal dimension of poly-ortho-aminophenol film and its thickness in the presence of different anions was studied using the peak current scaling in cyclic voltammetry (CV). There is a meaningful relation between the inner and outer cutoff (minimum and maximum length scale of the surface seen by the diffusing species, respectively) distinction in the polymer sensed by anions and the film charge transport resistance. The constant phase element exponent at low frequency was found to depend on the thickness of the poly-ortho-aminophenol film and on the applied potential during the impedance measurements. The constant phase element exponent dependence on the thickness of the film is explained by the film morphology and its dependence on the applied potential is interpreted by a change in the charge transport mechanism in the poly-ortho-aminophenol films.