NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification

The last chapter introduces a new method to verify the NBTI model and the correct implementation into a circuit aging simulator with real hardware measurements. An arbitrary waveform generator is used to drive single transistors in identical operation modes with identical sequence and proportion of each single operating point as during real circuit operation. In this manner, the calculated drift for one transistor in a circuit can be compared with a measurement drift for a given stress pattern.