کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
6946248 | 1450541 | 2016 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
An improved modeling for life prediction of high-power white LED based on Weibull right approximation method
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
Aiming at precisely predicting the life of the high-power white light LED (HPWLED), a three-parameter Weibull function and the right approximation method were employed to establish the luminance degradation model. The lumen maintenance data collected according to the IES LM-80-08 lumen maintenance test standard were fitted with and without error corrections, and the pseudo failure time of each HPWLED sample was extrapolated. The statistical analysis on the failure time was achieved by using Weibull distribution, normal distribution, lognormal distribution and Akaike Information Criterion (AIC). Then the life information was acquired. The results indicate that Weibull right approximation luminance degradation model (WRALDM) accurately reflects the variation of the lumen law with time. The failure time is accurately obtained. The best life distributions before and after the error correction to the lumen maintenance data are identified, based on AIC, as Weibull distribution and lognormal distribution, respectively. It is further confirmed by comparing the widths of life confidence interval and the life provided by the IES TM-21-11 method that the HPWLED life using WRALDM has a better accuracy. The optimized model provides researchers and manufacturers with significant guidelines for the further development of life prediction methodology.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 59, April 2016, Pages 49-54
Journal: Microelectronics Reliability - Volume 59, April 2016, Pages 49-54
نویسندگان
Jianping Zhang, Wenlong Chen, Chen Wang, Xiao Chen, Guoliang Cheng, Yingji Qiu, Helen Wu,