کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
701339 1460819 2007 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured by conducting probe atomic force microscopy
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured by conducting probe atomic force microscopy
چکیده انگلیسی

Local photoconductivity characterizations have been carried out on planar interdigitated metal-semiconductor-metal (MSM) devices fabricated on homoepitaxial CVD diamond for UV application. For this purpose a deuterium light source with an integrated UV fibre was combined and adapted to a conducting probe atomic force microscope (CP-AFM) tool. In this study, photocurrent was evidenced by local electrical resistance mapping measurements and analyzed as a function of the applied voltage and time.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Diamond and Related Materials - Volume 16, Issues 4–7, April–July 2007, Pages 1074–1077
نویسندگان
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